view_ciccapture.jpgCiC™ measurement takes "snapshots" of a part image as the part is continually moved beneath the system optics. VIEW's exclusive CiC technique can map a large surface area, stitching together individual images so they can be analyzed as a whole. Depending on the part geometry being measured, cycle time is reduced significantly without compromising measurement performance.

 


Measuring with Continuous Image Capture reduced the total inspection time by more than 50%

 

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VIEW systems are manufactured by Quality Vision International in Rochester, New York.