view_ciccapture.jpgCiC™ measurement takes "snapshots" of a part image as the part is continually moved beneath the system optics. VIEW's exclusive CiC technique can map a large surface area, stitching together individual images so they can be analyzed as a whole. Depending on the part geometry being measured, cycle time is reduced significantly without compromising measurement performance.


Measuring with Continuous Image Capture reduced the total inspection time by more than 50%


Terms of UsePrivacy PolicyVIEW PhoneVIEW Email

Quality Vision International

Copyright © 2019 Quality Vision International Inc.
All Rights Reserved.

 ISO Certified

VIEW systems are manufactured by Quality Vision International in Rochester, New York.