view_pinnacle_plus.jpgUltra-high accuracy dimensional metrology system.

Pinnacle+ Plus elevates Pinnacle performance to the next level. Pinnacle+ Plus features a rigid granite optical support structure and a high performance Z-axis motion assembly to produce the lowest possible uncertainty on micro-electronic parts and assemblies/

State-of-the-art linear motion control technology provides the fastest, most reliable platform available for high capacity operation in production environments ranging from clean rooms to factory floors.

Key Features and Options

Pinnacle+ Plus' state-of-the-art linear motion control technology provides the fastest, most reliable platform available for high volume, high capacity operation in production environments ranging from clean rooms to factory floors.

The Pinnacle+ Plus operates with one or more of VIEW's standard metrology software packages:

  • VIEW Metrology Software (VMS™) is standard on Pinnacle+ Plus and offers a wide array of standard measurement tools as well as a built-in scripting language to enable custom-functions.
  • Elements® CAD-to-Measure software is optional on Pinnacle+ Plus and provides automatic translation of 2-D CAD files in measurement programs, enabling very fast set-up of measurement routines for even the most complex parts.
  • Measure-X® metrology software is optional on Pinnacle+ Plus, guiding users through measurement routines with its intuitive point and click interfaces.

Specifications

 StandardOptional
X,Y,Z Travel250x150x100 mm
Load Capacity25 kg
Imaging OpticsSingle magnification, fixed lens optics with factory configurable back tube (1X standard) and field interchangeable front lens options (5X standard).
Metrology Camera2.0 megapixel, 1/2 inch, digital monochrome5.0 megapixel, 1/2 inch, digital, monochrome
2.0 megapixel 1/2 inch, digital monochrome
IlluminationAll LED coaxial through-the-lens surface light and below-the-stage back lightMulti-color programmable ring light
Grid autofocus system
Sensor Options Through-the-lens (TTL) laser Spectra Probe white light range sensor
Off-axis triangulation laser
Measurement ModesHigh Speed Move and Measure (MAM)Continuous Image Capture (CIC)

Datasheet

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VIEW systems are manufactured by Quality Vision International in Rochester, New York.