VIEW Systems & Software


Critical Dimensional Measurement Systems

Seeing and measuring the impossible

VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.

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Benchmark 250

A compact, high-accuracy dimensional measurement system

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Benchmark 450

Exceptional value in a high-accuracy dimensional measurement system

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VIEW Benchmark 624

Benchmark 624

Large transport dimensional measurement system

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Benchmark XLT

Extra large format dimensional metrology system

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Pinnacle 250

A high throughput, high-accuracy dimensional metrology system

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Pinnacle Plus

Elevates Pinnacle performance to the next level

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Summit 600/800

A large travel, high-accuracy dimensional measurement system

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Microline 300

Offers exceptional linewidth and overlay measurement capability

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Precis 200

Delivers sub-micron field-of-view and point-to-point measurement accuracy

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Quality Vision International

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VIEW systems are manufactured by Quality Vision International in Rochester, New York.