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A compact, high-accuracy dimensional metrology system.

The VIEW Benchmark™ 250 is engineered for high accuracy in a compact benchtop configuration complete with VIEW’s dual magnification optics and metrology-grade construction.

The Benchmark 250 is designed for use on the production floor to provide precision measurements for process control. Its compact size and powerful software make the Benchmark 250 a versatile measurement system that can be easily configured as either a dedicated gauge for critical dimension measurements or as a general purpose vision measurement system for routine quality monitoring.

Key Features and Options

The Benchmark 250 is well suited to measure many types of components, including molded plastic parts, machined parts, electronic assemblies, semiconductor packages, fiber optic components, disk media substrates, recording head dies, or semiconductor wafers up to 150 mm in diameter.

The Benchmark 250 operates with one or more of VIEW's standard metrology software packages:

Specifications

 StandardOptional
X,Y,Z Travel300x150x150 mm
Load Capacity25 kg
Imaging OpticsDual magnification, fixed lens optics with field interchangeable front lens. VIEW 2.5X front lens included as standard. Low mag has 1:1 with front lens; high mag has 4:1 with front lens.Single magnification, fixed lens optics with factory configurable back tube and field interchangeable front lens. VIEW 1X back tube and 2.5X front lens included as standard.
Metrology Camera1.4 megapixel, 1/2 inch, digital monochrome1.4 megapixel, 2/3 inch, digital, monochrome
2.0 megapixel 1/2 inch, digital monochrome
IlluminationAll LED coaxial through-the-lens surface light and below-the-stage back lightMulti-color programmable ring light
Grid autofocus system
Sensor Options Through-the-lens (TTL) laser Spectra Probe white light range sensor
Off-axis triangulation laser
Measurement ModesHigh Speed Move and Measure (MAM)Continuous Image Capture (CIC)

Datasheets

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VIEW systems are manufactured by Quality Vision International in Rochester, New York.