Seeing and measuring the impossible

VIEW Micro-Metrology offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.

	Pinnacle 250 A high throughput, high-accuracy dimensional metrology system learn more		Benchmark 250 A compact, high-accuracy dimensional measurement system learn more		Benchmark 450/600 Exceptional value in a high-accuracy dimensional measurement system learn more		Summit 450/600/800 A large travel, high-accuracy dimensional measurement system learn more
	MicroLine 300/400 Offers exceptional linewidth and overlay measurement capability learn more		Precis 200 Delivers sub-micron field-of-view and point-to-point measurement accuracy learn more

VIEW Micro-Metrology provides many services including installation and training when purchasing a new system. Read More >