Slider inspection is a critical data storage manufacturing process that presents difficult challenges from a metrology perspective. Slider inspection requires the acquisition and measurement of relatively small feature sizes with tight tolerances while also demanding short cycle times to provide high throughput for large production volumes. Partial or missing features can lead to expensive failures and scraping or rework of finished drive assemblies. In addition, the inherently low-contrast backgrounds in some slider inspection operations can require sophisticated lighting and/or through-the-lens laser technologies for consistent high-throughput measurements.