VIEW Micro-Metrology is committed to sharing its technical knowledge and expertise in the field of ultra high-precision non-contact measurement. Learn more about this important technology by viewing recently-published technical articles and press releases below, or visit the VIEW Micro-Metrology booth at an upcoming trade show.

Technical Articles

Download a recent technical article:

• Don't Thing Small - Think Micro
• "Microscopy Tests Fiber-Optic Parts"
• "Precision Measurement of Fiber-Optic Components"
• "The 'Hole Story' for FED Flat-Panel Displays" 
• "Quality Measurement: Be Precise with Optical Measurement"
• "Versatile Non-Contact Measurement"

Recent Press Releases

See the latest news from Micro-Metric:

•  Ultra High-Precision IMS-44M System Extends Slider ABS Metrology to >200 GB/IN² Heads
•  Innova™ Measurement System is Ready for Nanotechnology
•  MicroLine™ 520 Performs Critical Dimension Measurement on Semiconductor Wafers
•  MicroLine 300 Solves Measurement Problems on Wafers and Photomasks
•  Micro-Metric Acquisition by VIEW Engineering Signals Expanded Market Coverage

Upcoming Trade Shows

Visit VIEW Micro-Metrology at these upcoming trade shows:

• Semicon Singapore
  May 5-7th
  Booth #919 (Hall 4)
  
• Semicon West
  July 15-17th
  Moscone Center, San Francisco
  Booth #7837 (West Hall Level 1)
• International Manufacturing Technology Show (IMTS)
  September 8-13th
  McCormick Place
  Chicago, Illinois Booth