No matter what the requirement for ultra high-precision measurement, VIEW Micro-Metrology has the ideal solution. VIEW Micro-Metrology non-contact measurement systems utilize sub-pixel image feature detection with either field-of-view (FOV) or point-to-point (PTP) configurations for exceptional accuracy and repeatability. From etch-dimensions on hard disk drive (HDD) heads to semiconductor overlay measurements, we provide the accuracy you need for quality manufacturing. Click on the link below to learn more about ultra-high precision non-contact measurement.
Precision Measurement Solutions For Process Control |
Semiconductor Overlay
Measure overlay registrations on wafers to 200 mm
Inkjet Nozzle
Measure flow feature and orifice diameter and position with sub-micron accuracy
Fiber-Optic Measurement
Measure fiber alignment within the ferrule with nanometer precision
Tape Head
Perform integrated assembly and measurement of tape heads
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HDD Etch Dimension
Precise etch dimension measurement of slider abs features on hard disk heads
FED Hole Measurement
Measure gate plate diameters as small as one micron
Precision Assembly
Measure and dynamically adjust relative position of components in micro-assembly operations
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