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No matter what the requirement for ultra high-precision measurement, VIEW Micro-Metrology has the ideal solution. VIEW Micro-Metrology
non-contact measurement systems utilize sub-pixel image feature detection with either field-of-view (FOV) or point-to-point (PTP) configurations for exceptional accuracy
and repeatability. From etch-dimensions on hard disk drive (HDD) heads to semiconductor overlay measurements, we provide the accuracy you need for quality manufacturing.
Click on the links below to learn more about ultra-high precision non-contact measurement.
Precision Measurement Solutions For Process Control
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Semiconductor
Measure overlay registrations on wafers to 200 mm
Inkjet Nozzle
Measure flow feature and orifice diameter and position with sub-micron accuracy
Data Storage
Leading-edge non-contact metrology solutions for specific data storage applications
Electronic Assembly
Targeted metrology solutions for electronics assembly
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Microelectronics
Metrology solutions for microelectronics applications
Precision Assembly and Fabrication
Measure and dynamically adjust relative position of components in micro-assembly operations
MEMS
Ensure precision motion and motion detection
Custom Engineering
Complete, turnkey solutions for customers requiring integrated measurement and manufacturing solutions
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