VIEW Micro-Metrology Global. Agile. Expert.

Key Technologies


VIEW Micro-Metrology systems achieve their high accuracy, reliability, and throughput from nine core technologies:


Illumination View Integrated Laser Optiions Digital Megapixel Camera
Optics Ronchi Grid
CiC Continuous Image Capture Technology
Area Multi-Focus (AMF) Blaze VIEW Integrated Laser Optiions