Metrology solutions for fiber optic interconnect components require high accuracy and throughput. For example, many fiber optic assemblies must adhere to production tolerances in the sub-micron range in order to support new high-speed communications infrastructures. To support these escalating requirements, metrology solutions such as those used to inspect the alignment, diameter, and roundness of fiber optic ferrules must combine very high quality optics, lighting, image processing, and super high-resolution stage motion. In addition, advanced features such as programmable temperature compensation and sub-pixel addressing can be critical for achieving the ultra-high accuracy and repeatability required in fiber optic applications.