The Benchmark 250 is a compact general-purpose metrology system with all the features and capabilities of the larger VIEW
Micro-Metrology models. With travel of 300 x 150 x 150 mm, the Benchmark can accommodate a wide range of part sizes, and is rugged
enough to be located in either a Q/A lab or an inspection station on the production floor.
The Benchmark 250 includes a precision compound X-Y stage, and VIEW Micro-Metrology’s exclusive dual magnification optics. An
optional laser sensor adds unparalleled Z-axis measurement capability to this compact system.
The Benchmark 250 is well suited to measure many types of components, including molded plastic parts,
machined parts, electronic assemblies, semiconductor packages,
fiber optic components, disk media substrates,
recording head die, or semiconductor wafers up to 150 mm in diameter.
The Benchmark 250 operates with one or more of VIEW Micro-Metrology’s standard metrology software packages:
|Benchmark 250 Specifications
||300 x 150 x 150 mm (12 x 6 x 6 in.)
||720 x 775 x 873 mm (28.3 x 30.5 x 38.3 in.)
||Dual Magnification (Objective Lens X)
|Standard Objective Lens
|Optional Objective Lenses
||0.8x, 2.5x, 5x
LED Coaxial surface light
Multi-color Programmable Ring Light (PRL)
Ronchi Grid Autofocus
Rotary Index Table