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About VIEW Micro-Metrology
 VIEW Micro-Metrology (formerly Micro-Metric) is the micro / nano-measurement group of VIEW Engineering.
Founded in 1979, VIEW Micro-Metrology produces high accuracy, visible light microscopy systems for critical dimension and coordinate metrology applications in the semiconductor, MEMs, Data Storage, Display and Solar Junction industries.
VIEW Micro-Metrology offers standard metrology systems with capabilities ranging from semi-automatic CD measurement to fully automated CD, overlay and coordinate measurement. We also offer customized solutions including tailored software and additional non-contact sensors, such as integrated thin-film thickness. Our modular product design and software allows us to configure a metrology system to meet your specific application requirements.
Based in San Jose, Ca., VIEW Micro-Metrology’s customer base includes many of the world’s leading manufacturers or specialty semiconductors, hard disk recording heads and MEMs devices. VIEW Micro-Metrology is proud to be a supplier to the National Institute of Standards (NIST).
In 2005, Micro-Metric merged with VIEW Engineering to form the Micro-Metrology Group of Quality Vision International, Inc., the world’s largest vision metrology company. This merger benefits Micro-Metric customers through access to a worldwide network of engineering, manufacturing and software resources and strengthens the QVI commitment to process metrology.
Together with our partners, VIEW Micro-Metrology combines more than 30-years of experience in ultra-high precision, non-contact measurement, and an experienced worldwide sales and service organization to ensure peak system performance and productivity.
Contact Us For More Information
Please contact our sales, applications support or field service team directly if you’d like more information of assistance:
By Phone: Toll Free: (U.S. Only) 1-800-490-3333
Direct: 1-408-452-8505
By E-Mail: sales@viewmm.com
service@viewmm.com
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